Real-Time Monitoring Method and Circuit Based on Built-In Reliability Prediction

Real-Time Monitoring Method and Circuit Based on Built-In Reliability Prediction

The failure of different chips under working conditions is influenced by various stress states such as different voltages, temperatures, stress durations, and stress variations. Therefore, the failure time has a great degree of dispersion, and similar chips may exhibit different failure mechanisms d...

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Bibliographic Details
Main Authors: Wenke Ren, Yanning Chen, Xiaoming Li, Xinjie Zhou, Baichen Song, Tianci Chang
Format: Article
Language:English
Published: MDPI AG 2024-12-01
Series:Micromachines
Subjects:
real-time monitoring
reliability prediction
on-chip monitor
parameter degradation
Online Access:https://www.mdpi.com/2072-666X/16/1/4
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