APA (7th ed.) Citation

Jang, S., & Kim, G. A monitoring method of semiconductor manufacturing processes using Internet of Things–based big data analysis. Wiley.

Chicago Style (17th ed.) Citation

Jang, Seok-Woo, and Gye-Young Kim. A Monitoring Method of Semiconductor Manufacturing Processes Using Internet of Things–based Big Data Analysis. Wiley.

MLA (9th ed.) Citation

Jang, Seok-Woo, and Gye-Young Kim. A Monitoring Method of Semiconductor Manufacturing Processes Using Internet of Things–based Big Data Analysis. Wiley.

Warning: These citations may not always be 100% accurate.