3D fruit microstructure characterization using micro-CT imaging and deep learning-based panoptic segmentation

3D fruit microstructure characterization using micro-CT imaging and deep learning-based panoptic segmentation

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Bibliographic Details
Main Authors: Van Doorselaer Leen, Verboven Pieter, Nicolaï Bart
Format: Article
Language:English
Published: EDP Sciences 2024-01-01
Series:BIO Web of Conferences
Subjects:
x-ray micro-ct
image processing
ai
Online Access:https://www.bio-conferences.org/articles/bioconf/pdf/2024/48/bioconf_emc2024_10014.pdf
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