Leen, V. D., Pieter, V., & Bart, N. 3D fruit microstructure characterization using micro-CT imaging and deep learning-based panoptic segmentation. EDP Sciences.
Chicago Style (17th ed.) CitationLeen, Van Doorselaer, Verboven Pieter, and Nicolaï Bart. 3D Fruit Microstructure Characterization Using Micro-CT Imaging and Deep Learning-based Panoptic Segmentation. EDP Sciences.
MLA (9th ed.) CitationLeen, Van Doorselaer, et al. 3D Fruit Microstructure Characterization Using Micro-CT Imaging and Deep Learning-based Panoptic Segmentation. EDP Sciences.
Warning: These citations may not always be 100% accurate.