In Situ Quantification of a Wetted Surface Area during Scanning Electrochemical Cell Microscopy Using Retraction Curves
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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American Chemical Society
2024-10-01
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| Series: | ACS Measurement Science Au |
| Online Access: | https://doi.org/10.1021/acsmeasuresciau.4c00042 |
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| _version_ | 1850149245773938688 |
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| author | Nishtha Saxena Emmanuel Mena-Morcillo Mia Tripp Peter George Keech Mehran Behazin Samantha Michelle Gateman |
| author_facet | Nishtha Saxena Emmanuel Mena-Morcillo Mia Tripp Peter George Keech Mehran Behazin Samantha Michelle Gateman |
| author_sort | Nishtha Saxena |
| collection | DOAJ |
| format | Article |
| id | doaj-art-d863537506ba4a61925c84eb5ee6fdbf |
| institution | OA Journals |
| issn | 2694-250X |
| language | English |
| publishDate | 2024-10-01 |
| publisher | American Chemical Society |
| record_format | Article |
| series | ACS Measurement Science Au |
| spelling | doaj-art-d863537506ba4a61925c84eb5ee6fdbf2025-08-20T02:26:59ZengAmerican Chemical SocietyACS Measurement Science Au2694-250X2024-10-015217818810.1021/acsmeasuresciau.4c00042In Situ Quantification of a Wetted Surface Area during Scanning Electrochemical Cell Microscopy Using Retraction CurvesNishtha Saxena0Emmanuel Mena-Morcillo1Mia Tripp2Peter George Keech3Mehran Behazin4Samantha Michelle Gateman5Department of Chemistry, The University of Western Ontario, London, Ontario, CanadaDepartment of Chemistry, The University of Western Ontario, London, Ontario, CanadaDepartment of Chemistry, The University of Western Ontario, London, Ontario, CanadaNuclear Waste Management Organization, Toronto, Ontario, CanadaNuclear Waste Management Organization, Toronto, Ontario, CanadaDepartment of Chemistry, The University of Western Ontario, London, Ontario, Canadahttps://doi.org/10.1021/acsmeasuresciau.4c00042 |
| spellingShingle | Nishtha Saxena Emmanuel Mena-Morcillo Mia Tripp Peter George Keech Mehran Behazin Samantha Michelle Gateman In Situ Quantification of a Wetted Surface Area during Scanning Electrochemical Cell Microscopy Using Retraction Curves ACS Measurement Science Au |
| title | In Situ Quantification of a Wetted Surface Area during Scanning Electrochemical Cell Microscopy Using Retraction Curves |
| title_full | In Situ Quantification of a Wetted Surface Area during Scanning Electrochemical Cell Microscopy Using Retraction Curves |
| title_fullStr | In Situ Quantification of a Wetted Surface Area during Scanning Electrochemical Cell Microscopy Using Retraction Curves |
| title_full_unstemmed | In Situ Quantification of a Wetted Surface Area during Scanning Electrochemical Cell Microscopy Using Retraction Curves |
| title_short | In Situ Quantification of a Wetted Surface Area during Scanning Electrochemical Cell Microscopy Using Retraction Curves |
| title_sort | in situ quantification of a wetted surface area during scanning electrochemical cell microscopy using retraction curves |
| url | https://doi.org/10.1021/acsmeasuresciau.4c00042 |
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