In Situ Quantification of a Wetted Surface Area during Scanning Electrochemical Cell Microscopy Using Retraction Curves

In Situ Quantification of a Wetted Surface Area during Scanning Electrochemical Cell Microscopy Using Retraction Curves

Saved in:
Bibliographic Details
Main Authors: Nishtha Saxena, Emmanuel Mena-Morcillo, Mia Tripp, Peter George Keech, Mehran Behazin, Samantha Michelle Gateman
Format: Article
Language:English
Published: American Chemical Society 2024-10-01
Series:ACS Measurement Science Au
Online Access:https://doi.org/10.1021/acsmeasuresciau.4c00042
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
ISSN:2694-250X

Similar Items