Nonstoichiometry in TiO2−y Studied by Ion Beam Methods and Photoelectron Spectroscopy

This paper treats a problem of nonstoichiometry in TiO2−y thin films deposited by reactive sputtering at controlled sputtering rates. Ion beam techniques, Rutherford backscattering (RBS), and nuclear reaction analysis (NRA) along with X-ray photoelectron spectroscopy have been applied to determine a...

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Bibliographic Details
Main Author: K. Zakrzewska
Format: Article
Language:English
Published: Wiley 2012-01-01
Series:Advances in Materials Science and Engineering
Online Access:http://dx.doi.org/10.1155/2012/826873
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