Scalable Noise Characterization of Syndrome-Extraction Circuits with Averaged Circuit Eigenvalue Sampling
Characterizing the performance of noisy quantum circuits is central to the production of prototype quantum computers and can enable improved quantum error correction that exploits noise biases identified in a quantum device. We develop a scalable noise-characterization protocol suited to characteriz...
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| Main Authors: | Evan T. Hockings, Andrew C. Doherty, Robin Harper |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2025-02-01
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| Series: | PRX Quantum |
| Online Access: | http://doi.org/10.1103/PRXQuantum.6.010334 |
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