APA (7th ed.) Citation

Hockings, E. T., Doherty, A. C., & Harper, R. Scalable Noise Characterization of Syndrome-Extraction Circuits with Averaged Circuit Eigenvalue Sampling. American Physical Society.

Chicago Style (17th ed.) Citation

Hockings, Evan T., Andrew C. Doherty, and Robin Harper. Scalable Noise Characterization of Syndrome-Extraction Circuits with Averaged Circuit Eigenvalue Sampling. American Physical Society.

MLA (9th ed.) Citation

Hockings, Evan T., et al. Scalable Noise Characterization of Syndrome-Extraction Circuits with Averaged Circuit Eigenvalue Sampling. American Physical Society.