Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution
Electronic devices are integral part of our life and modeling their lifetime is the most challenging and interesting field in reliability analysis. To investigate the failure behavior of electronic devices reliability analysis is commonly used. In the literature, however, it is reported that one in...
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| Format: | Article |
| Language: | English |
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IEEE
2020-01-01
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| Series: | IEEE Access |
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| Online Access: | https://ieeexplore.ieee.org/document/9110822/ |
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| author | Sajid Ali Shafaqat Ali Ismail Shah Ghazanfar Farooq Siddiqui Tanzila Saba Amjad Rehman |
| author_facet | Sajid Ali Shafaqat Ali Ismail Shah Ghazanfar Farooq Siddiqui Tanzila Saba Amjad Rehman |
| author_sort | Sajid Ali |
| collection | DOAJ |
| description | Electronic devices are integral part of our life and modeling their lifetime is the most challenging and interesting field in reliability analysis. To investigate the failure behavior of electronic devices reliability analysis is commonly used. In the literature, however, it is reported that one in five electronic device failure is a result of corrosion and to save electricity and predict future failures, it is important to summarize the data by some flexible probability models. This will not only help the electronic companies, but also the users by providing them information about the maximum voltage level that a particular device can bear. This article deals with the reliability analysis of electronic devices under different voltages assuming modified generalized exponential distribution and beta generalized exponential distribution using the inverse power law rule. The parameters of the modified distribution are estimated assuming Bayesian inference to include prior information. Sensitivity of hyperparameters and selection of an appropriate probability model is also a part of this study. |
| format | Article |
| id | doaj-art-d5054ff3fbff4d9c81aa4db3a2683f53 |
| institution | Kabale University |
| issn | 2169-3536 |
| language | English |
| publishDate | 2020-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Access |
| spelling | doaj-art-d5054ff3fbff4d9c81aa4db3a2683f532025-08-22T23:11:55ZengIEEEIEEE Access2169-35362020-01-01810862910864410.1109/ACCESS.2020.30009519110822Reliability Analysis for Electronic Devices Using Generalized Exponential DistributionSajid Ali0https://orcid.org/0000-0003-4868-7932Shafaqat Ali1Ismail Shah2https://orcid.org/0000-0001-5005-6991Ghazanfar Farooq Siddiqui3https://orcid.org/0000-0003-0291-3287Tanzila Saba4https://orcid.org/0000-0003-3138-3801Amjad Rehman5https://orcid.org/0000-0002-3817-2655Department of Statistics, Quaid-i-Azam University, Islamabad, PakistanDepartment of Statistics, Quaid-i-Azam University, Islamabad, PakistanDepartment of Statistics, Quaid-i-Azam University, Islamabad, PakistanDepartment of Computer Science, Quaid-i-Azam University, Islamabad, PakistanArtificial Intelligence and Data Analytics Laboratory, CCIS, Prince Sultan University, Riyadh, Saudi ArabiaArtificial Intelligence and Data Analytics Laboratory, CCIS, Prince Sultan University, Riyadh, Saudi ArabiaElectronic devices are integral part of our life and modeling their lifetime is the most challenging and interesting field in reliability analysis. To investigate the failure behavior of electronic devices reliability analysis is commonly used. In the literature, however, it is reported that one in five electronic device failure is a result of corrosion and to save electricity and predict future failures, it is important to summarize the data by some flexible probability models. This will not only help the electronic companies, but also the users by providing them information about the maximum voltage level that a particular device can bear. This article deals with the reliability analysis of electronic devices under different voltages assuming modified generalized exponential distribution and beta generalized exponential distribution using the inverse power law rule. The parameters of the modified distribution are estimated assuming Bayesian inference to include prior information. Sensitivity of hyperparameters and selection of an appropriate probability model is also a part of this study.https://ieeexplore.ieee.org/document/9110822/Electronic devicesbeta generalized exponential distributionBayesian analysisgeneralized exponential distributioninverse power lawsensitivity analysis |
| spellingShingle | Sajid Ali Shafaqat Ali Ismail Shah Ghazanfar Farooq Siddiqui Tanzila Saba Amjad Rehman Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution IEEE Access Electronic devices beta generalized exponential distribution Bayesian analysis generalized exponential distribution inverse power law sensitivity analysis |
| title | Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution |
| title_full | Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution |
| title_fullStr | Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution |
| title_full_unstemmed | Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution |
| title_short | Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution |
| title_sort | reliability analysis for electronic devices using generalized exponential distribution |
| topic | Electronic devices beta generalized exponential distribution Bayesian analysis generalized exponential distribution inverse power law sensitivity analysis |
| url | https://ieeexplore.ieee.org/document/9110822/ |
| work_keys_str_mv | AT sajidali reliabilityanalysisforelectronicdevicesusinggeneralizedexponentialdistribution AT shafaqatali reliabilityanalysisforelectronicdevicesusinggeneralizedexponentialdistribution AT ismailshah reliabilityanalysisforelectronicdevicesusinggeneralizedexponentialdistribution AT ghazanfarfarooqsiddiqui reliabilityanalysisforelectronicdevicesusinggeneralizedexponentialdistribution AT tanzilasaba reliabilityanalysisforelectronicdevicesusinggeneralizedexponentialdistribution AT amjadrehman reliabilityanalysisforelectronicdevicesusinggeneralizedexponentialdistribution |