Preparation and Study Annealing Effect on Structure and Optical Properties of ZnIn2(Se0.8Te0.2)4 Thin Film
The thermal evaporation technique is used to investigate the structural and optical properties of ZnIn2(Se1-0.2Te0.2)4 (ZIST) chalcopyrite semiconductors. ZnIn2(Se0.8Te0.2)4 thin films with a thickness of 500 nm are taken into consideration, and the effect of annealing at various temperatures range...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
University of Baghdad
2025-01-01
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| Series: | Ibn Al-Haitham Journal for Pure and Applied Sciences |
| Subjects: | |
| Online Access: | https://jih.uobaghdad.edu.iq/index.php/j/article/view/3982 |
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