Almatrafi, M., & Belaïd, M. A. Corrigendum to “Numerical and experimental investigation of temperature dependence vs. mobility degradation on I–V characteristics in N-LDMOS structure” [Case Stud. Therm. Eng. (59), July 2024, 104515]. Elsevier.
Chicago Style (17th ed.) CitationAlmatrafi, Mohammed, and Mohamed Ali Belaïd. Corrigendum to “Numerical and Experimental Investigation of Temperature Dependence Vs. Mobility Degradation on I–V Characteristics in N-LDMOS Structure” [Case Stud. Therm. Eng. (59), July 2024, 104515]. Elsevier.
MLA (9th ed.) CitationAlmatrafi, Mohammed, and Mohamed Ali Belaïd. Corrigendum to “Numerical and Experimental Investigation of Temperature Dependence Vs. Mobility Degradation on I–V Characteristics in N-LDMOS Structure” [Case Stud. Therm. Eng. (59), July 2024, 104515]. Elsevier.