APA (7th ed.) Citation

Baptiste, B., Alban, A., Hiba, H., Sylvain, L. G., Jean-Paul, K., & Jean-François, G. Contactless defects detection using modulated photoluminescence technique: Model for a single Shockley-Read-Hall trap in a semiconductor thin layer. EDP Sciences.

Chicago Style (17th ed.) Citation

Baptiste, Bérenguier, Asseko Alban, Haddara Hiba, Le Gall Sylvain, Kleider Jean-Paul, and Guillemoles Jean-François. Contactless Defects Detection Using Modulated Photoluminescence Technique: Model for a Single Shockley-Read-Hall Trap in a Semiconductor Thin Layer. EDP Sciences.

MLA (9th ed.) Citation

Baptiste, Bérenguier, et al. Contactless Defects Detection Using Modulated Photoluminescence Technique: Model for a Single Shockley-Read-Hall Trap in a Semiconductor Thin Layer. EDP Sciences.