Enhanced Rail Surface Defect Segmentation Using Polarization Imaging and Dual-Stream Feature Fusion
Rail surface defects pose significant risks to the operational efficiency and safety of industrial equipment. Traditional visual defect detection methods typically rely on high-quality RGB images; however, they struggle in low-light conditions due to small, low-contrast defects that blend into compl...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-06-01
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| Series: | Sensors |
| Subjects: | |
| Online Access: | https://www.mdpi.com/1424-8220/25/11/3546 |
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| Summary: | Rail surface defects pose significant risks to the operational efficiency and safety of industrial equipment. Traditional visual defect detection methods typically rely on high-quality RGB images; however, they struggle in low-light conditions due to small, low-contrast defects that blend into complex backgrounds. Therefore, this paper proposes a novel defect segmentation method leveraging a dual-stream feature fusion network that combines polarization images with DeepLabV3+. The approach utilizes the pruned MobileNetV3 as the backbone network, incorporating a coordinate attention mechanism for feature extraction. This reduces the number of model parameters and enhances computational efficiency. The dual-stream module implements cascade and addition strategies to effectively merge shallow and deep features from both the original and polarization images. This enhances the detection of low-contrast defects in complex backgrounds. Furthermore, the CBAM is integrated into the decoding area to refine feature fusion and mitigate the issue of missing small-target defects. Experimental results demonstrate that the enhanced DeepLabV3+ model outperforms existing models such as U-Net, PSPNet, and the original DeepLabV3+ in terms of MIoU and MPA metrics, achieving 73.00% and 80.59%, respectively. The comprehensive detection accuracy reaches 97.82%, meeting the demanding requirements for effective rail surface defect detection. |
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| ISSN: | 1424-8220 |