Influence of radiation exposure on the properties of dielectric layers based on anodic aluminum oxide
Devices that are used in the aerospace industry must operate in extreme conditions, so it is important to understand how the properties of materials change under the influence of radiation and low temperatures. Anodic aluminum oxide, due to its mechanical and dielectric properties, is widely used in...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | Russian |
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Educational institution «Belarusian State University of Informatics and Radioelectronics»
2022-01-01
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| Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
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| Online Access: | https://doklady.bsuir.by/jour/article/view/3248 |
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| author | S. A. Biran D. A. Korotkevich A. V. Korotkevich K. V. Garifov A. D. Dashkevich |
| author_facet | S. A. Biran D. A. Korotkevich A. V. Korotkevich K. V. Garifov A. D. Dashkevich |
| author_sort | S. A. Biran |
| collection | DOAJ |
| description | Devices that are used in the aerospace industry must operate in extreme conditions, so it is important to understand how the properties of materials change under the influence of radiation and low temperatures. Anodic aluminum oxide, due to its mechanical and dielectric properties, is widely used in electronic devices with a high degree of integration. Radiation exposure can lead to degradation of the electrophysical parameters of dielectric films and can also change their chemical composition. The methods for studying the effect of radiation exposure on the dielectric properties of films are shown in this article. The research has been carried out and the results of the influence of α-particles on the dielectric properties of a porous film of anodic aluminum oxide during the influence of low temperature are presented. |
| format | Article |
| id | doaj-art-d0f4802f0f2a4225a16db784b2a185cf |
| institution | Kabale University |
| issn | 1729-7648 |
| language | Russian |
| publishDate | 2022-01-01 |
| publisher | Educational institution «Belarusian State University of Informatics and Radioelectronics» |
| record_format | Article |
| series | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| spelling | doaj-art-d0f4802f0f2a4225a16db784b2a185cf2025-08-20T03:45:06ZrusEducational institution «Belarusian State University of Informatics and Radioelectronics»Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki1729-76482022-01-01198687110.35596/1729-7648-2021-19-8-68-711766Influence of radiation exposure on the properties of dielectric layers based on anodic aluminum oxideS. A. Biran0D. A. Korotkevich1A. V. Korotkevich2K. V. Garifov3A. D. Dashkevich4Belarusian State University of Informatics and RadioelectronicsBelarusian State University of Informatics and RadioelectronicsBelarusian State University of Informatics and RadioelectronicsBelarusian State University of Informatics and RadioelectronicsBelarusian State University of Informatics and RadioelectronicsDevices that are used in the aerospace industry must operate in extreme conditions, so it is important to understand how the properties of materials change under the influence of radiation and low temperatures. Anodic aluminum oxide, due to its mechanical and dielectric properties, is widely used in electronic devices with a high degree of integration. Radiation exposure can lead to degradation of the electrophysical parameters of dielectric films and can also change their chemical composition. The methods for studying the effect of radiation exposure on the dielectric properties of films are shown in this article. The research has been carried out and the results of the influence of α-particles on the dielectric properties of a porous film of anodic aluminum oxide during the influence of low temperature are presented.https://doklady.bsuir.by/jour/article/view/3248anodic aluminaradiation exposureporous film |
| spellingShingle | S. A. Biran D. A. Korotkevich A. V. Korotkevich K. V. Garifov A. D. Dashkevich Influence of radiation exposure on the properties of dielectric layers based on anodic aluminum oxide Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki anodic alumina radiation exposure porous film |
| title | Influence of radiation exposure on the properties of dielectric layers based on anodic aluminum oxide |
| title_full | Influence of radiation exposure on the properties of dielectric layers based on anodic aluminum oxide |
| title_fullStr | Influence of radiation exposure on the properties of dielectric layers based on anodic aluminum oxide |
| title_full_unstemmed | Influence of radiation exposure on the properties of dielectric layers based on anodic aluminum oxide |
| title_short | Influence of radiation exposure on the properties of dielectric layers based on anodic aluminum oxide |
| title_sort | influence of radiation exposure on the properties of dielectric layers based on anodic aluminum oxide |
| topic | anodic alumina radiation exposure porous film |
| url | https://doklady.bsuir.by/jour/article/view/3248 |
| work_keys_str_mv | AT sabiran influenceofradiationexposureonthepropertiesofdielectriclayersbasedonanodicaluminumoxide AT dakorotkevich influenceofradiationexposureonthepropertiesofdielectriclayersbasedonanodicaluminumoxide AT avkorotkevich influenceofradiationexposureonthepropertiesofdielectriclayersbasedonanodicaluminumoxide AT kvgarifov influenceofradiationexposureonthepropertiesofdielectriclayersbasedonanodicaluminumoxide AT addashkevich influenceofradiationexposureonthepropertiesofdielectriclayersbasedonanodicaluminumoxide |