Reliability enhancement of EM-based tuning of microwave components using regularized operating band scanning

Abstract Numerical optimization is ubiquitous in contemporary microwave passive component design. Reliable quantification of electromagnetic (EM) cross-coupling, substrate losses, or environmental effects (e.g., connectors, housing) is impossible using analytical or equivalent network models. Conseq...

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Main Authors: Slawomir Koziel, Anna Pietrenko-Dabrowska
Format: Article
Language:English
Published: Nature Portfolio 2025-07-01
Series:Scientific Reports
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Online Access:https://doi.org/10.1038/s41598-025-13107-y
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author Slawomir Koziel
Anna Pietrenko-Dabrowska
author_facet Slawomir Koziel
Anna Pietrenko-Dabrowska
author_sort Slawomir Koziel
collection DOAJ
description Abstract Numerical optimization is ubiquitous in contemporary microwave passive component design. Reliable quantification of electromagnetic (EM) cross-coupling, substrate losses, or environmental effects (e.g., connectors, housing) is impossible using analytical or equivalent network models. Consequently, the designs rendered using such tools must be further tuned at the EM simulation level. Although local algorithms are predominantly employed for this purpose, they are likely to fail if the starting point is of insufficient quality. On the other hand, global search techniques are associated with tremendous computational expenses. This study suggests an innovative technique for immunizing local algorithms against poor starting points, enabling their quasi-global search capability. The presented methodology reformulates the underlying optimization task by evaluating the circuit performance concerning the target operating bands scanned within the predefined ranges and by adding penalty factors proportional to the distance between the original and the scanned targets. The penalized objective is computed as the minimum of the above combination over the entire scanning range. As a result, the design specifications become attainable through local optimization over considerably broader frequency spectra at the expense of only a slight increase in the algorithm running costs. The presented approach is comprehensively verified using several microstrip components and the sensitivity-based routine as the search algorithm. The results unanimously showcase the ability of the procedure to allocate the optimum even under troublesome scenarios (poor initial points), which are unmanageable by conventional algorithms.
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spelling doaj-art-cfea8afa997343c8af97a610f54c5b172025-08-20T03:46:01ZengNature PortfolioScientific Reports2045-23222025-07-0115111510.1038/s41598-025-13107-yReliability enhancement of EM-based tuning of microwave components using regularized operating band scanningSlawomir Koziel0Anna Pietrenko-Dabrowska1Engineering Optimization & Modeling Center, Reykjavik UniversityFaculty of Electronics, Telecommunications and Informatics, Gdansk University of TechnologyAbstract Numerical optimization is ubiquitous in contemporary microwave passive component design. Reliable quantification of electromagnetic (EM) cross-coupling, substrate losses, or environmental effects (e.g., connectors, housing) is impossible using analytical or equivalent network models. Consequently, the designs rendered using such tools must be further tuned at the EM simulation level. Although local algorithms are predominantly employed for this purpose, they are likely to fail if the starting point is of insufficient quality. On the other hand, global search techniques are associated with tremendous computational expenses. This study suggests an innovative technique for immunizing local algorithms against poor starting points, enabling their quasi-global search capability. The presented methodology reformulates the underlying optimization task by evaluating the circuit performance concerning the target operating bands scanned within the predefined ranges and by adding penalty factors proportional to the distance between the original and the scanned targets. The penalized objective is computed as the minimum of the above combination over the entire scanning range. As a result, the design specifications become attainable through local optimization over considerably broader frequency spectra at the expense of only a slight increase in the algorithm running costs. The presented approach is comprehensively verified using several microstrip components and the sensitivity-based routine as the search algorithm. The results unanimously showcase the ability of the procedure to allocate the optimum even under troublesome scenarios (poor initial points), which are unmanageable by conventional algorithms.https://doi.org/10.1038/s41598-025-13107-yMicrowave circuitsDesign automationEM-based optimizationTarget band scanningRegularization
spellingShingle Slawomir Koziel
Anna Pietrenko-Dabrowska
Reliability enhancement of EM-based tuning of microwave components using regularized operating band scanning
Scientific Reports
Microwave circuits
Design automation
EM-based optimization
Target band scanning
Regularization
title Reliability enhancement of EM-based tuning of microwave components using regularized operating band scanning
title_full Reliability enhancement of EM-based tuning of microwave components using regularized operating band scanning
title_fullStr Reliability enhancement of EM-based tuning of microwave components using regularized operating band scanning
title_full_unstemmed Reliability enhancement of EM-based tuning of microwave components using regularized operating band scanning
title_short Reliability enhancement of EM-based tuning of microwave components using regularized operating band scanning
title_sort reliability enhancement of em based tuning of microwave components using regularized operating band scanning
topic Microwave circuits
Design automation
EM-based optimization
Target band scanning
Regularization
url https://doi.org/10.1038/s41598-025-13107-y
work_keys_str_mv AT slawomirkoziel reliabilityenhancementofembasedtuningofmicrowavecomponentsusingregularizedoperatingbandscanning
AT annapietrenkodabrowska reliabilityenhancementofembasedtuningofmicrowavecomponentsusingregularizedoperatingbandscanning