APA (7th ed.) Citation

Tai, Y., Tu, C., Lin, C., & Lu, C. Reliability of Gap-Type Thin Film Transistors Under Low Illumination for Imaging Sensing Applications. IEEE.

Chicago Style (17th ed.) Citation

Tai, Ya-Hsiang, Chih-Chung Tu, Chi-Hao Lin, and Chi-Fan Lu. Reliability of Gap-Type Thin Film Transistors Under Low Illumination for Imaging Sensing Applications. IEEE.

MLA (9th ed.) Citation

Tai, Ya-Hsiang, et al. Reliability of Gap-Type Thin Film Transistors Under Low Illumination for Imaging Sensing Applications. IEEE.