A Novel GRU-Augmented Time-Frequency Estimator for IGBT Remaining Useful Life Prediction
Aging-induced failure of Insulated Gate Bipolar Transistors (IGBTs) significantly restricts the reliability of power electronic systems. Accurate and efficient prediction of IGBT Remaining Useful Life (RUL) is critical for proactive risk mitigation and ensuring system stability. Despite numerous exi...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11083544/ |
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