Steep Subthreshold Slope Gate-Controlled Carrier-Injection SOI Transistor for Ultralow Power Applications

In this study, we investigated the basic characteristics of the n- and p-type gate-controlled carrier-injection silicon-on-insulator transistor (GCCI SOI-Tr). The devices exhibited steep subthreshold slope (< 1 mV/dec) and realized ultralow voltage swing (< 0.2 V) from the low...

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Main Authors: Haruki Yonezaki, Takayuki Mori, Jiro Ida
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Journal of the Electron Devices Society
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Online Access:https://ieeexplore.ieee.org/document/10855637/
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author Haruki Yonezaki
Takayuki Mori
Jiro Ida
author_facet Haruki Yonezaki
Takayuki Mori
Jiro Ida
author_sort Haruki Yonezaki
collection DOAJ
description In this study, we investigated the basic characteristics of the n- and p-type gate-controlled carrier-injection silicon-on-insulator transistor (GCCI SOI-Tr). The devices exhibited steep subthreshold slope (&#x003C; 1 mV/dec) and realized ultralow voltage swing (&#x003C; 0.2 V) from the low leakage current level (&#x003C; 1 pA) and the high on-current (&#x003E; <inline-formula> <tex-math notation="LaTeX">$1~\mu $ </tex-math></inline-formula>A) at low drain voltage (=&#x00B1; 0.1 V), respectively. GCCI SOI-Tr has the potential for application as an ultralow power complementary metal-oxide-semiconductor (MOS). Owing to its BiMOS-like structure, GCCI SOI-Tr is compatible with the amplification ability and high impedance by a gate. Therefore, this device is promising for ultralow-power applications.
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publishDate 2025-01-01
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spelling doaj-art-ccccdbf494a746d48b1c907e25ad58ca2025-08-20T02:53:06ZengIEEEIEEE Journal of the Electron Devices Society2168-67342025-01-011389289810.1109/JEDS.2025.352917610855637Steep Subthreshold Slope Gate-Controlled Carrier-Injection SOI Transistor for Ultralow Power ApplicationsHaruki Yonezaki0https://orcid.org/0009-0007-7284-5837Takayuki Mori1https://orcid.org/0000-0002-9199-0868Jiro Ida2https://orcid.org/0000-0002-9161-1725Kanazawa Institute of Technology, Nonoichi, JapanKanazawa Institute of Technology, Nonoichi, JapanKanazawa Institute of Technology, Tokyo, JapanIn this study, we investigated the basic characteristics of the n- and p-type gate-controlled carrier-injection silicon-on-insulator transistor (GCCI SOI-Tr). The devices exhibited steep subthreshold slope (&#x003C; 1 mV/dec) and realized ultralow voltage swing (&#x003C; 0.2 V) from the low leakage current level (&#x003C; 1 pA) and the high on-current (&#x003E; <inline-formula> <tex-math notation="LaTeX">$1~\mu $ </tex-math></inline-formula>A) at low drain voltage (=&#x00B1; 0.1 V), respectively. GCCI SOI-Tr has the potential for application as an ultralow power complementary metal-oxide-semiconductor (MOS). Owing to its BiMOS-like structure, GCCI SOI-Tr is compatible with the amplification ability and high impedance by a gate. Therefore, this device is promising for ultralow-power applications.https://ieeexplore.ieee.org/document/10855637/CMOSfeedbackfloating body effectSOI MOSFETsteep subthreshold slope
spellingShingle Haruki Yonezaki
Takayuki Mori
Jiro Ida
Steep Subthreshold Slope Gate-Controlled Carrier-Injection SOI Transistor for Ultralow Power Applications
IEEE Journal of the Electron Devices Society
CMOS
feedback
floating body effect
SOI MOSFET
steep subthreshold slope
title Steep Subthreshold Slope Gate-Controlled Carrier-Injection SOI Transistor for Ultralow Power Applications
title_full Steep Subthreshold Slope Gate-Controlled Carrier-Injection SOI Transistor for Ultralow Power Applications
title_fullStr Steep Subthreshold Slope Gate-Controlled Carrier-Injection SOI Transistor for Ultralow Power Applications
title_full_unstemmed Steep Subthreshold Slope Gate-Controlled Carrier-Injection SOI Transistor for Ultralow Power Applications
title_short Steep Subthreshold Slope Gate-Controlled Carrier-Injection SOI Transistor for Ultralow Power Applications
title_sort steep subthreshold slope gate controlled carrier injection soi transistor for ultralow power applications
topic CMOS
feedback
floating body effect
SOI MOSFET
steep subthreshold slope
url https://ieeexplore.ieee.org/document/10855637/
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AT takayukimori steepsubthresholdslopegatecontrolledcarrierinjectionsoitransistorforultralowpowerapplications
AT jiroida steepsubthresholdslopegatecontrolledcarrierinjectionsoitransistorforultralowpowerapplications