Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources
Nanoradian precision has been achieved in control of X-ray optics using feedback from optical interferometric measurements and real time adjustments of three mirrors in a simulated X-ray laser cavity in recent work reported by Koehlenbeck et al.
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Light Publishing Group
2025-08-01
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| Series: | Light: Advanced Manufacturing |
| Subjects: | |
| Online Access: | https://www.light-am.com/article/doi/10.37188/lam.2025.038 |
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