Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources
Nanoradian precision has been achieved in control of X-ray optics using feedback from optical interferometric measurements and real time adjustments of three mirrors in a simulated X-ray laser cavity in recent work reported by Koehlenbeck et al.
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| Format: | Article |
| Language: | English |
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Light Publishing Group
2025-08-01
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| Series: | Light: Advanced Manufacturing |
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| Online Access: | https://www.light-am.com/article/doi/10.37188/lam.2025.038 |
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| _version_ | 1849684047022784512 |
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| author | Ting Guo Jennifer Lien |
| author_facet | Ting Guo Jennifer Lien |
| author_sort | Ting Guo |
| collection | DOAJ |
| description | Nanoradian precision has been achieved in control of X-ray optics using feedback from optical interferometric measurements and real time adjustments of three mirrors in a simulated X-ray laser cavity in recent work reported by Koehlenbeck et al. |
| format | Article |
| id | doaj-art-cbf71d5651fe4673b8f0263a67b9ac6a |
| institution | DOAJ |
| issn | 2689-9620 |
| language | English |
| publishDate | 2025-08-01 |
| publisher | Light Publishing Group |
| record_format | Article |
| series | Light: Advanced Manufacturing |
| spelling | doaj-art-cbf71d5651fe4673b8f0263a67b9ac6a2025-08-20T03:23:35ZengLight Publishing GroupLight: Advanced Manufacturing2689-96202025-08-016219519610.37188/lam.2025.038Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sourcesTing GuoJennifer LienNanoradian precision has been achieved in control of X-ray optics using feedback from optical interferometric measurements and real time adjustments of three mirrors in a simulated X-ray laser cavity in recent work reported by Koehlenbeck et al.https://www.light-am.com/article/doi/10.37188/lam.2025.038precisionmotioncontrolx-ray optics |
| spellingShingle | Ting Guo Jennifer Lien Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources Light: Advanced Manufacturing precision motion control x-ray optics |
| title | Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources |
| title_full | Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources |
| title_fullStr | Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources |
| title_full_unstemmed | Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources |
| title_short | Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources |
| title_sort | precision motion control of x ray optics assisted with optical interferometric metrology for advanced x ray beam sources |
| topic | precision motion control x-ray optics |
| url | https://www.light-am.com/article/doi/10.37188/lam.2025.038 |
| work_keys_str_mv | AT tingguo precisionmotioncontrolofxrayopticsassistedwithopticalinterferometricmetrologyforadvancedxraybeamsources AT jenniferlien precisionmotioncontrolofxrayopticsassistedwithopticalinterferometricmetrologyforadvancedxraybeamsources |