Analog Circuits Fault Diagnosis Using ISM Technique and a GA-SVM Classifier Approach
This present work aims to contribute to the solution of the problems encountered in electronic circuits fault diagnosis. One of these troubleshoots faced is the lack of effective features that help to optimize fault classifier and hence improve circuit fault detection and identification. Thus,...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
University of Banja Luka
2024-12-01
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| Series: | Electronics |
| Online Access: | https://els-journal.net/wp/?page_id=849 |
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