APA (7th ed.) Citation

Zhou, R., Gravesteijn, D. J., & Hueting, R. J. E. Impact of Defects on the Low-Field Electron Mobility in GaN-on-Si HEMTs. IEEE.

Chicago Style (17th ed.) Citation

Zhou, Ran, D. J. Gravesteijn, and R. J. E. Hueting. Impact of Defects on the Low-Field Electron Mobility in GaN-on-Si HEMTs. IEEE.

MLA (9th ed.) Citation

Zhou, Ran, et al. Impact of Defects on the Low-Field Electron Mobility in GaN-on-Si HEMTs. IEEE.