APA (7th ed.) Citation

Ziegelwanger, T., Reisinger, M., Vedad, B., Hlushko, K., Petegem, S. V., Todt, J., . . . Keckes, J. 20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates. Elsevier.

Chicago Style (17th ed.) Citation

Ziegelwanger, T., M. Reisinger, B. Vedad, K. Hlushko, S. Van Petegem, J. Todt, M. Meindlhumer, and J. Keckes. 20 KHz X-ray Diffraction on Cu Thin Films Explores Thermomechanical Fatigue at High Strain-rates. Elsevier.

MLA (9th ed.) Citation

Ziegelwanger, T., et al. 20 KHz X-ray Diffraction on Cu Thin Films Explores Thermomechanical Fatigue at High Strain-rates. Elsevier.