Modeling and Simulation of Insulin Pump Set Failures Based on the Power Flow Method

The insulin pump is a critical device for intensive insulin therapy in diabetic patients. Failures in insulin pump sets such as blockage and leakage can disrupt normal insulin delivery, potentially causing hyperglycemia or life-threatening diabetic ketoacidosis. Developing a mathematical model to ac...

Full description

Saved in:
Bibliographic Details
Main Authors: Weijie Wang, Dinghui Guo, Long Quan, Shiwei Liu
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10938156/
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1849702132390821888
author Weijie Wang
Dinghui Guo
Long Quan
Shiwei Liu
author_facet Weijie Wang
Dinghui Guo
Long Quan
Shiwei Liu
author_sort Weijie Wang
collection DOAJ
description The insulin pump is a critical device for intensive insulin therapy in diabetic patients. Failures in insulin pump sets such as blockage and leakage can disrupt normal insulin delivery, potentially causing hyperglycemia or life-threatening diabetic ketoacidosis. Developing a mathematical model to accurately describe the failure mechanisms of insulin pump sets is essential for fault diagnosis and performance optimization. However, modeling these systems is challenging due to the interplay of rigid and elastic constraints (e.g., needles and hoses) and multi-domain interactions (e.g., fluid insulin and solid components). To address these challenges, this study establishes a mathematical model for insulin pump sets with blockage and leakage faults based on the power flow method. The model is used to investigate the effects of these faults on insulin fluid dynamics, with a focus on impacts of failures at various positions. Numerical results demonstrate a maximum relative error of 0.57% compared to simulation data. Findings reveal that leakage faults closer to the flow source significantly reduce the output flow rate and chamber pressure. Conversely, as blockage approach the flow source, the impact on reducing flow rate diminishes, while their influence on increasing chamber pressure becomes more pronounced. Notably, when the blockage thickness exceeds 0.6 mm, both flow rate and pressure are markedly affected, with the effects intensifying as the thickness increases.
format Article
id doaj-art-c8984ae467434f4db85e35ba8e8580a4
institution DOAJ
issn 2169-3536
language English
publishDate 2025-01-01
publisher IEEE
record_format Article
series IEEE Access
spelling doaj-art-c8984ae467434f4db85e35ba8e8580a42025-08-20T03:17:44ZengIEEEIEEE Access2169-35362025-01-0113592545926310.1109/ACCESS.2025.355426110938156Modeling and Simulation of Insulin Pump Set Failures Based on the Power Flow MethodWeijie Wang0https://orcid.org/0000-0002-0650-2656Dinghui Guo1https://orcid.org/0009-0003-7562-4379Long Quan2https://orcid.org/0000-0001-8148-1771Shiwei Liu3Department of Endocrinology, Shanxi Bethune Hospital, Taiyuan, ChinaCollege of Mechanical Engineering, Taiyuan University of Technology, Taiyuan, ChinaCollege of Mechanical Engineering, Taiyuan University of Technology, Taiyuan, ChinaDepartment of Endocrinology, Shanxi Bethune Hospital, Taiyuan, ChinaThe insulin pump is a critical device for intensive insulin therapy in diabetic patients. Failures in insulin pump sets such as blockage and leakage can disrupt normal insulin delivery, potentially causing hyperglycemia or life-threatening diabetic ketoacidosis. Developing a mathematical model to accurately describe the failure mechanisms of insulin pump sets is essential for fault diagnosis and performance optimization. However, modeling these systems is challenging due to the interplay of rigid and elastic constraints (e.g., needles and hoses) and multi-domain interactions (e.g., fluid insulin and solid components). To address these challenges, this study establishes a mathematical model for insulin pump sets with blockage and leakage faults based on the power flow method. The model is used to investigate the effects of these faults on insulin fluid dynamics, with a focus on impacts of failures at various positions. Numerical results demonstrate a maximum relative error of 0.57% compared to simulation data. Findings reveal that leakage faults closer to the flow source significantly reduce the output flow rate and chamber pressure. Conversely, as blockage approach the flow source, the impact on reducing flow rate diminishes, while their influence on increasing chamber pressure becomes more pronounced. Notably, when the blockage thickness exceeds 0.6 mm, both flow rate and pressure are markedly affected, with the effects intensifying as the thickness increases.https://ieeexplore.ieee.org/document/10938156/Insulin pump setspower flow modeling and simulationfailure mechanism analysis
spellingShingle Weijie Wang
Dinghui Guo
Long Quan
Shiwei Liu
Modeling and Simulation of Insulin Pump Set Failures Based on the Power Flow Method
IEEE Access
Insulin pump sets
power flow modeling and simulation
failure mechanism analysis
title Modeling and Simulation of Insulin Pump Set Failures Based on the Power Flow Method
title_full Modeling and Simulation of Insulin Pump Set Failures Based on the Power Flow Method
title_fullStr Modeling and Simulation of Insulin Pump Set Failures Based on the Power Flow Method
title_full_unstemmed Modeling and Simulation of Insulin Pump Set Failures Based on the Power Flow Method
title_short Modeling and Simulation of Insulin Pump Set Failures Based on the Power Flow Method
title_sort modeling and simulation of insulin pump set failures based on the power flow method
topic Insulin pump sets
power flow modeling and simulation
failure mechanism analysis
url https://ieeexplore.ieee.org/document/10938156/
work_keys_str_mv AT weijiewang modelingandsimulationofinsulinpumpsetfailuresbasedonthepowerflowmethod
AT dinghuiguo modelingandsimulationofinsulinpumpsetfailuresbasedonthepowerflowmethod
AT longquan modelingandsimulationofinsulinpumpsetfailuresbasedonthepowerflowmethod
AT shiweiliu modelingandsimulationofinsulinpumpsetfailuresbasedonthepowerflowmethod