Probing Functional Thin Films with Grazing Incidence X-Ray Scattering: The Power of Indexing

Grazing incidence small- and wide-angle X-ray scattering (GISAXS, GIWAXS) has been widely applied for the study of functional thin films, be it for the characterization of nanostructured morphologies in block copolymers, nanocomposites, and nanoparticle assemblies, or for the packing and orientation...

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Bibliographic Details
Main Author: Detlef-M. Smilgies
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/15/1/63
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