APA (7th ed.) Citation

Kumar, S., Diestel, C., Al-Hajjawi, S., Schmitz, J., Hemsendorf, M., Haunschild, J., . . . Rein, S. Inline Mapping of Amorphous Silicon Layer Thickness of Heterojunction Precursors Using Multispectral Imaging. TIB Open Publishing.

Chicago Style (17th ed.) Citation

Kumar, Saravana, Christian Diestel, Saed Al-Hajjawi, Jurriaan Schmitz, Marc Hemsendorf, Jonas Haunschild, Stefan J. Rupitsch, and Stefan Rein. Inline Mapping of Amorphous Silicon Layer Thickness of Heterojunction Precursors Using Multispectral Imaging. TIB Open Publishing.

MLA (9th ed.) Citation

Kumar, Saravana, et al. Inline Mapping of Amorphous Silicon Layer Thickness of Heterojunction Precursors Using Multispectral Imaging. TIB Open Publishing.