Lifetime Prediction of Power IGBT Module
The Weibull methodology for power cycling test data and some reported typical lifetime models were firstly discussed. Then, lifetime prediction procedures were presented including the conversion of mission profile to temperature profile, the temperature cycles counting by Rainflow algorithm, and lif...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | zho |
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Editorial Department of Electric Drive for Locomotives
2013-01-01
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| Series: | 机车电传动 |
| Subjects: | |
| Online Access: | http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128x.2013.02.004 |
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| _version_ | 1849729339710504960 |
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| author | WANG Yan-gang Chamund Dinesh LI Shi-ping Jones Steve DOU Ze-chun XIN Lan-yuan LIU Guo-you |
| author_facet | WANG Yan-gang Chamund Dinesh LI Shi-ping Jones Steve DOU Ze-chun XIN Lan-yuan LIU Guo-you |
| author_sort | WANG Yan-gang |
| collection | DOAJ |
| description | The Weibull methodology for power cycling test data and some reported typical lifetime models were firstly discussed. Then, lifetime prediction procedures were presented including the conversion of mission profile to temperature profile, the temperature cycles counting by Rainflow algorithm, and lifetime calculating based on the fatigue linear accumulation damage theory and lifetime models. Lastly, as an example, power cycling lifetime of 3 300 V/1 200 A IGBT modules manufactured by Zhuzhou CSR Times Electric Co., Ltd., subjected to the application of HXD1C locomotive was predicted. |
| format | Article |
| id | doaj-art-c6520121b02e4fe7989eb8e67a06d497 |
| institution | DOAJ |
| issn | 1000-128X |
| language | zho |
| publishDate | 2013-01-01 |
| publisher | Editorial Department of Electric Drive for Locomotives |
| record_format | Article |
| series | 机车电传动 |
| spelling | doaj-art-c6520121b02e4fe7989eb8e67a06d4972025-08-20T03:09:15ZzhoEditorial Department of Electric Drive for Locomotives机车电传动1000-128X2013-01-01131720910597Lifetime Prediction of Power IGBT ModuleWANG Yan-gangChamund DineshLI Shi-pingJones SteveDOU Ze-chunXIN Lan-yuanLIU Guo-youThe Weibull methodology for power cycling test data and some reported typical lifetime models were firstly discussed. Then, lifetime prediction procedures were presented including the conversion of mission profile to temperature profile, the temperature cycles counting by Rainflow algorithm, and lifetime calculating based on the fatigue linear accumulation damage theory and lifetime models. Lastly, as an example, power cycling lifetime of 3 300 V/1 200 A IGBT modules manufactured by Zhuzhou CSR Times Electric Co., Ltd., subjected to the application of HXD1C locomotive was predicted.http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128x.2013.02.004IGBT modulereliabilitypower cycling testfailure mechanismlifetime prediction |
| spellingShingle | WANG Yan-gang Chamund Dinesh LI Shi-ping Jones Steve DOU Ze-chun XIN Lan-yuan LIU Guo-you Lifetime Prediction of Power IGBT Module 机车电传动 IGBT module reliability power cycling test failure mechanism lifetime prediction |
| title | Lifetime Prediction of Power IGBT Module |
| title_full | Lifetime Prediction of Power IGBT Module |
| title_fullStr | Lifetime Prediction of Power IGBT Module |
| title_full_unstemmed | Lifetime Prediction of Power IGBT Module |
| title_short | Lifetime Prediction of Power IGBT Module |
| title_sort | lifetime prediction of power igbt module |
| topic | IGBT module reliability power cycling test failure mechanism lifetime prediction |
| url | http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128x.2013.02.004 |
| work_keys_str_mv | AT wangyangang lifetimepredictionofpowerigbtmodule AT chamunddinesh lifetimepredictionofpowerigbtmodule AT lishiping lifetimepredictionofpowerigbtmodule AT jonessteve lifetimepredictionofpowerigbtmodule AT douzechun lifetimepredictionofpowerigbtmodule AT xinlanyuan lifetimepredictionofpowerigbtmodule AT liuguoyou lifetimepredictionofpowerigbtmodule |