Lifetime Prediction of Power IGBT Module

The Weibull methodology for power cycling test data and some reported typical lifetime models were firstly discussed. Then, lifetime prediction procedures were presented including the conversion of mission profile to temperature profile, the temperature cycles counting by Rainflow algorithm, and lif...

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Main Authors: WANG Yan-gang, Chamund Dinesh, LI Shi-ping, Jones Steve, DOU Ze-chun, XIN Lan-yuan, LIU Guo-you
Format: Article
Language:zho
Published: Editorial Department of Electric Drive for Locomotives 2013-01-01
Series:机车电传动
Subjects:
Online Access:http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128x.2013.02.004
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_version_ 1849729339710504960
author WANG Yan-gang
Chamund Dinesh
LI Shi-ping
Jones Steve
DOU Ze-chun
XIN Lan-yuan
LIU Guo-you
author_facet WANG Yan-gang
Chamund Dinesh
LI Shi-ping
Jones Steve
DOU Ze-chun
XIN Lan-yuan
LIU Guo-you
author_sort WANG Yan-gang
collection DOAJ
description The Weibull methodology for power cycling test data and some reported typical lifetime models were firstly discussed. Then, lifetime prediction procedures were presented including the conversion of mission profile to temperature profile, the temperature cycles counting by Rainflow algorithm, and lifetime calculating based on the fatigue linear accumulation damage theory and lifetime models. Lastly, as an example, power cycling lifetime of 3 300 V/1 200 A IGBT modules manufactured by Zhuzhou CSR Times Electric Co., Ltd., subjected to the application of HXD1C locomotive was predicted.
format Article
id doaj-art-c6520121b02e4fe7989eb8e67a06d497
institution DOAJ
issn 1000-128X
language zho
publishDate 2013-01-01
publisher Editorial Department of Electric Drive for Locomotives
record_format Article
series 机车电传动
spelling doaj-art-c6520121b02e4fe7989eb8e67a06d4972025-08-20T03:09:15ZzhoEditorial Department of Electric Drive for Locomotives机车电传动1000-128X2013-01-01131720910597Lifetime Prediction of Power IGBT ModuleWANG Yan-gangChamund DineshLI Shi-pingJones SteveDOU Ze-chunXIN Lan-yuanLIU Guo-youThe Weibull methodology for power cycling test data and some reported typical lifetime models were firstly discussed. Then, lifetime prediction procedures were presented including the conversion of mission profile to temperature profile, the temperature cycles counting by Rainflow algorithm, and lifetime calculating based on the fatigue linear accumulation damage theory and lifetime models. Lastly, as an example, power cycling lifetime of 3 300 V/1 200 A IGBT modules manufactured by Zhuzhou CSR Times Electric Co., Ltd., subjected to the application of HXD1C locomotive was predicted.http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128x.2013.02.004IGBT modulereliabilitypower cycling testfailure mechanismlifetime prediction
spellingShingle WANG Yan-gang
Chamund Dinesh
LI Shi-ping
Jones Steve
DOU Ze-chun
XIN Lan-yuan
LIU Guo-you
Lifetime Prediction of Power IGBT Module
机车电传动
IGBT module
reliability
power cycling test
failure mechanism
lifetime prediction
title Lifetime Prediction of Power IGBT Module
title_full Lifetime Prediction of Power IGBT Module
title_fullStr Lifetime Prediction of Power IGBT Module
title_full_unstemmed Lifetime Prediction of Power IGBT Module
title_short Lifetime Prediction of Power IGBT Module
title_sort lifetime prediction of power igbt module
topic IGBT module
reliability
power cycling test
failure mechanism
lifetime prediction
url http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128x.2013.02.004
work_keys_str_mv AT wangyangang lifetimepredictionofpowerigbtmodule
AT chamunddinesh lifetimepredictionofpowerigbtmodule
AT lishiping lifetimepredictionofpowerigbtmodule
AT jonessteve lifetimepredictionofpowerigbtmodule
AT douzechun lifetimepredictionofpowerigbtmodule
AT xinlanyuan lifetimepredictionofpowerigbtmodule
AT liuguoyou lifetimepredictionofpowerigbtmodule