Utilizing Block Copolymer Films as an Etch Mask for Pattern Transfer
Saved in:
| Main Authors: | Chang Eon Kim, Jae Won Shim, Seok Jun Ham, Seung Hyun Kim |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
American Chemical Society
2025-02-01
|
| Series: | ACS Omega |
| Online Access: | https://doi.org/10.1021/acsomega.4c10935 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Enhanced etch characteristics of EUV PR masked SiON through the ion beam grid pulsing technique
by: Hae In Kwon, et al.
Published: (2025-06-01) -
Low-dielectric, nanoporous polyimide thin films prepared from block copolymer templating
by: C. Wang, et al.
Published: (2013-08-01) -
Synthesis of Dextran/Methoxy Poly(ethylene glycol) Block Copolymer
by: Young-Il Jeong, et al.
Published: (2013-01-01) -
Morphology-properties relationship on nanocomposite films based on poly(styrene-block-diene-block-styrene) copolymers and silver nanoparticles
Published: (2011-02-01) -
Preparation and self-assembly behavior of polystyrene-block-poly (dimethylaminoethyl methacrylate) amphiphilic block copolymer using atom transfer radical polymerization
Published: (2008-03-01)