Digging into the Atomistic Details of the TaN/MgO Interface: An Ab Initio Study Supported by Transmission Electron Microscopy
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| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Chemical Society
2025-01-01
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| Series: | ACS Materials Au |
| Online Access: | https://doi.org/10.1021/acsmaterialsau.4c00173 |
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| ISSN: | 2694-2461 |
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