Thermal field reconstruction based on weighted dictionary learning
Abstract Dynamic thermal management (DTM) is applied to address the thermal problem of high performance very‐large‐scale integrated chips. The false alarm rate (FAR) can be used to evaluate the impact of full‐chip thermal field reconstruction accuracy on DTM. A low FAR relies on the accurate reconst...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley
2022-05-01
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| Series: | IET Circuits, Devices and Systems |
| Subjects: | |
| Online Access: | https://doi.org/10.1049/cds2.12098 |
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