Measurement of the crystallization and phase transition of niobium dioxide thin-films using a tube furnace optical transmission system

Niobium dioxide has a volatile memristive phase change that occurs ∼800 °C that makes it an ideal candidate for future neuromorphic electronics. A straightforward optical system has been developed on a horizontal tube furnace for in situ spectral measurements as an as-grown Nb2O5 film is annealed an...

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Main Authors: Zachary R. Robinson, Karsten Beckmann, James Michels, Vincent Daviero, Elizabeth A. Street, Fiona Lorenzen, Matthew C. Sullivan, Nathaniel Cady, Alexander C. Kozen, Jeffrey M. Woodward, Marc Currie
Format: Article
Language:English
Published: AIP Publishing LLC 2024-11-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0228400
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_version_ 1850178782162321408
author Zachary R. Robinson
Karsten Beckmann
James Michels
Vincent Daviero
Elizabeth A. Street
Fiona Lorenzen
Matthew C. Sullivan
Nathaniel Cady
Alexander C. Kozen
Jeffrey M. Woodward
Marc Currie
author_facet Zachary R. Robinson
Karsten Beckmann
James Michels
Vincent Daviero
Elizabeth A. Street
Fiona Lorenzen
Matthew C. Sullivan
Nathaniel Cady
Alexander C. Kozen
Jeffrey M. Woodward
Marc Currie
author_sort Zachary R. Robinson
collection DOAJ
description Niobium dioxide has a volatile memristive phase change that occurs ∼800 °C that makes it an ideal candidate for future neuromorphic electronics. A straightforward optical system has been developed on a horizontal tube furnace for in situ spectral measurements as an as-grown Nb2O5 film is annealed and ultimately crystallizes as NbO2. The system measures the changing spectral transmissivity of Nb2O5 as it undergoes both reduction and crystallization processes. We were also able to measure the transition from metallic-to-non-metallic NbO2 during the cooldown phase, which is shown to occur about 100 °C lower on a sapphire substrate than fused silica. After annealing, the material properties of the Nb2O5 and NbO2 were assessed via x-ray photoelectron spectroscopy, x-ray diffraction, and 4-point resistivity, confirming that we have made crystalline NbO2.
format Article
id doaj-art-c39b855cf6a94c05810277ea90b50295
institution OA Journals
issn 2158-3226
language English
publishDate 2024-11-01
publisher AIP Publishing LLC
record_format Article
series AIP Advances
spelling doaj-art-c39b855cf6a94c05810277ea90b502952025-08-20T02:18:39ZengAIP Publishing LLCAIP Advances2158-32262024-11-011411115113115113-710.1063/5.0228400Measurement of the crystallization and phase transition of niobium dioxide thin-films using a tube furnace optical transmission systemZachary R. Robinson0Karsten Beckmann1James Michels2Vincent Daviero3Elizabeth A. Street4Fiona Lorenzen5Matthew C. Sullivan6Nathaniel Cady7Alexander C. Kozen8Jeffrey M. Woodward9Marc Currie10Department of Physics, SUNY Brockport, Brockport, Rochester, New York 14420, USANY CREATES, Albany, New York 12203, USADepartment of Physics, SUNY Brockport, Brockport, Rochester, New York 14420, USADepartment of Physics, SUNY Brockport, Brockport, Rochester, New York 14420, USADepartment of Physics, SUNY Brockport, Brockport, Rochester, New York 14420, USADepartment of Physics and Astronomy, Ithaca College, Ithaca, New York 14850, USADepartment of Physics and Astronomy, Ithaca College, Ithaca, New York 14850, USACollege of Nanotechnology, Science and Engineering, University at Albany, Albany, New York 12203, USADepartment of Physics, University of Vermont, Burlington, Vermont 05405, USAU.S. Naval Research Laboratory, Washington, District of Columbia 20375, USAU.S. Naval Research Laboratory, Washington, District of Columbia 20375, USANiobium dioxide has a volatile memristive phase change that occurs ∼800 °C that makes it an ideal candidate for future neuromorphic electronics. A straightforward optical system has been developed on a horizontal tube furnace for in situ spectral measurements as an as-grown Nb2O5 film is annealed and ultimately crystallizes as NbO2. The system measures the changing spectral transmissivity of Nb2O5 as it undergoes both reduction and crystallization processes. We were also able to measure the transition from metallic-to-non-metallic NbO2 during the cooldown phase, which is shown to occur about 100 °C lower on a sapphire substrate than fused silica. After annealing, the material properties of the Nb2O5 and NbO2 were assessed via x-ray photoelectron spectroscopy, x-ray diffraction, and 4-point resistivity, confirming that we have made crystalline NbO2.http://dx.doi.org/10.1063/5.0228400
spellingShingle Zachary R. Robinson
Karsten Beckmann
James Michels
Vincent Daviero
Elizabeth A. Street
Fiona Lorenzen
Matthew C. Sullivan
Nathaniel Cady
Alexander C. Kozen
Jeffrey M. Woodward
Marc Currie
Measurement of the crystallization and phase transition of niobium dioxide thin-films using a tube furnace optical transmission system
AIP Advances
title Measurement of the crystallization and phase transition of niobium dioxide thin-films using a tube furnace optical transmission system
title_full Measurement of the crystallization and phase transition of niobium dioxide thin-films using a tube furnace optical transmission system
title_fullStr Measurement of the crystallization and phase transition of niobium dioxide thin-films using a tube furnace optical transmission system
title_full_unstemmed Measurement of the crystallization and phase transition of niobium dioxide thin-films using a tube furnace optical transmission system
title_short Measurement of the crystallization and phase transition of niobium dioxide thin-films using a tube furnace optical transmission system
title_sort measurement of the crystallization and phase transition of niobium dioxide thin films using a tube furnace optical transmission system
url http://dx.doi.org/10.1063/5.0228400
work_keys_str_mv AT zacharyrrobinson measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem
AT karstenbeckmann measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem
AT jamesmichels measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem
AT vincentdaviero measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem
AT elizabethastreet measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem
AT fionalorenzen measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem
AT matthewcsullivan measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem
AT nathanielcady measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem
AT alexanderckozen measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem
AT jeffreymwoodward measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem
AT marccurrie measurementofthecrystallizationandphasetransitionofniobiumdioxidethinfilmsusingatubefurnaceopticaltransmissionsystem