Long-Term Analysis of Temperature and Current-Dependent Degradation in Green High-Power Light-Emitting Diodes

Long-Term Analysis of Temperature and Current-Dependent Degradation in Green High-Power Light-Emitting Diodes

We report on the degradation dynamics and mechanisms of commercially available green high-power light-emitting diodes (LEDs) with a peak wavelength of 522 nm. The stress tests were carried out for up to 8800 hours with forward currents ranging from 350 mA to 1000 mA at junction temperatures between...

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Bibliographic Details
Main Authors: Alexander Herzog, Matteo Buffolo, Francesco Piva, Simon Benkner, Babak Zandi, Jens Balasus, Paul Myland, Felix Wirth, Willem D. van Driel, Matteo Meneghini, Tran Quoc Khanh
Format: Article
Language:English
Published: IEEE 2025-01-01
Series:IEEE Access
Subjects:
Light-emitting diode (LED)
InGaN
high-power LED
reliability
accelerated stress test
green LEDs
Online Access:https://ieeexplore.ieee.org/document/11127023/
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