Long-Term Analysis of Temperature and Current-Dependent Degradation in Green High-Power Light-Emitting Diodes
We report on the degradation dynamics and mechanisms of commercially available green high-power light-emitting diodes (LEDs) with a peak wavelength of 522 nm. The stress tests were carried out for up to 8800 hours with forward currents ranging from 350 mA to 1000 mA at junction temperatures between...
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| Main Authors: | , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11127023/ |
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| Summary: | We report on the degradation dynamics and mechanisms of commercially available green high-power light-emitting diodes (LEDs) with a peak wavelength of 522 nm. The stress tests were carried out for up to 8800 hours with forward currents ranging from 350 mA to 1000 mA at junction temperatures between 86 C and 155 C. Two complementary test designs were used to isolate temperature- and current-driven effects. The results of the accelerated tests reveal the following key findings: 1.) A square-root–time-dependent loss in the quantum wells caused by the generation of point defects, leading to up to 90 % flux reduction within the first 500 hours at low forward currents. 2.) A logarithmic decay governed by defect-induced carrier-injection loss, evident above <inline-formula> <tex-math notation="LaTeX">$I_{\mathrm {EQE,max}}$ </tex-math></inline-formula> and accompanied by a spectral red shift. 3.) A temperature-activated blue shift with an activation energy of <inline-formula> <tex-math notation="LaTeX">$E_{\mathrm {a}}$ </tex-math></inline-formula>=0.23 eV, indicating the coexistence of competing degradation mechanisms. The interplay between different mechanisms results in an enhanced device lifetime at higher stress temperatures and stands in contrast to previous findings reported in the literature. 4.) The isothermal stress test indicates a cubic acceleration of degradation with carrier density, implicating Auger-Meitner-generated hot electrons in defect formation. These insights provide guidance for mitigating reliability issues of green high-power LEDs in future devices. |
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| ISSN: | 2169-3536 |