Multi-Bit Resistive Random-Access Memory Based on Two-Dimensional MoO<sub>3</sub> Layers

Two-dimensional (2D) material-based resistive random-access memory (RRAM) has emerged as a promising solution for neuromorphic computing and computing-in-memory architectures. Compared to conventional metal-oxide-based RRAM, the novel 2D material-based RRAM devices demonstrate lower power consumptio...

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Main Authors: Kai Liu, Wengui Jiang, Liang Zhou, Yinkang Zhou, Minghui Hu, Yuchen Geng, Yiyuan Zhang, Yi Qiao, Rongming Wang, Yinghui Sun
Format: Article
Language:English
Published: MDPI AG 2025-07-01
Series:Nanomaterials
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Online Access:https://www.mdpi.com/2079-4991/15/13/1033
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_version_ 1849319627912380416
author Kai Liu
Wengui Jiang
Liang Zhou
Yinkang Zhou
Minghui Hu
Yuchen Geng
Yiyuan Zhang
Yi Qiao
Rongming Wang
Yinghui Sun
author_facet Kai Liu
Wengui Jiang
Liang Zhou
Yinkang Zhou
Minghui Hu
Yuchen Geng
Yiyuan Zhang
Yi Qiao
Rongming Wang
Yinghui Sun
author_sort Kai Liu
collection DOAJ
description Two-dimensional (2D) material-based resistive random-access memory (RRAM) has emerged as a promising solution for neuromorphic computing and computing-in-memory architectures. Compared to conventional metal-oxide-based RRAM, the novel 2D material-based RRAM devices demonstrate lower power consumption, higher integration density, and reduced performance variability, benefiting from their atomic-scale thickness and ultra-flat surfaces. Remarkably, 2D layered metal oxides retain these advantages while preserving the merits of traditional metal oxides, including their low cost and high environmental stability. Through a multi-step dry transfer process, we fabricated a Pd-MoO<sub>3</sub>-Ag RRAM device featuring 2D α-MoO<sub>3</sub> as the resistive switching layer, with Pd and Ag serving as inert and active electrodes, respectively. Resistive switching tests revealed an excellent operational stability, low write voltage (~0.5 V), high switching ratio (>10<sup>6</sup>), and multi-bit storage capability (≥3 bits). Nevertheless, the device exhibited a limited retention time (~2000 s). To overcome this limitation, we developed a Gr-MoO<sub>3</sub>-Ag heterostructure by substituting the Pd electrode with graphene (Gr). This modification achieved a fivefold improvement in the retention time (>10<sup>4</sup> s). These findings demonstrate that by controlling the type and thickness of 2D materials and resistive switching layers, RRAM devices with both high On/Off ratios and long-term data retention may be developed.
format Article
id doaj-art-c112759f17394c6f8d51e5c22e660e1f
institution Kabale University
issn 2079-4991
language English
publishDate 2025-07-01
publisher MDPI AG
record_format Article
series Nanomaterials
spelling doaj-art-c112759f17394c6f8d51e5c22e660e1f2025-08-20T03:50:21ZengMDPI AGNanomaterials2079-49912025-07-011513103310.3390/nano15131033Multi-Bit Resistive Random-Access Memory Based on Two-Dimensional MoO<sub>3</sub> LayersKai Liu0Wengui Jiang1Liang Zhou2Yinkang Zhou3Minghui Hu4Yuchen Geng5Yiyuan Zhang6Yi Qiao7Rongming Wang8Yinghui Sun9Beijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaBeijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaBeijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaBeijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaBeijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaBeijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaBeijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaThe State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing 100083, ChinaBeijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaBeijing Key Laboratory for Magneto-Photoelectrical Composite and Interface Science, School of Mathematics and Physics, University of Science and Technology Beijing, Beijing 100083, ChinaTwo-dimensional (2D) material-based resistive random-access memory (RRAM) has emerged as a promising solution for neuromorphic computing and computing-in-memory architectures. Compared to conventional metal-oxide-based RRAM, the novel 2D material-based RRAM devices demonstrate lower power consumption, higher integration density, and reduced performance variability, benefiting from their atomic-scale thickness and ultra-flat surfaces. Remarkably, 2D layered metal oxides retain these advantages while preserving the merits of traditional metal oxides, including their low cost and high environmental stability. Through a multi-step dry transfer process, we fabricated a Pd-MoO<sub>3</sub>-Ag RRAM device featuring 2D α-MoO<sub>3</sub> as the resistive switching layer, with Pd and Ag serving as inert and active electrodes, respectively. Resistive switching tests revealed an excellent operational stability, low write voltage (~0.5 V), high switching ratio (>10<sup>6</sup>), and multi-bit storage capability (≥3 bits). Nevertheless, the device exhibited a limited retention time (~2000 s). To overcome this limitation, we developed a Gr-MoO<sub>3</sub>-Ag heterostructure by substituting the Pd electrode with graphene (Gr). This modification achieved a fivefold improvement in the retention time (>10<sup>4</sup> s). These findings demonstrate that by controlling the type and thickness of 2D materials and resistive switching layers, RRAM devices with both high On/Off ratios and long-term data retention may be developed.https://www.mdpi.com/2079-4991/15/13/1033<i>α</i>-MoO<sub>3</sub> nanosheettwo-dimensional metal oxidesresistive switching layerresistive random access memorymultilevel storage
spellingShingle Kai Liu
Wengui Jiang
Liang Zhou
Yinkang Zhou
Minghui Hu
Yuchen Geng
Yiyuan Zhang
Yi Qiao
Rongming Wang
Yinghui Sun
Multi-Bit Resistive Random-Access Memory Based on Two-Dimensional MoO<sub>3</sub> Layers
Nanomaterials
<i>α</i>-MoO<sub>3</sub> nanosheet
two-dimensional metal oxides
resistive switching layer
resistive random access memory
multilevel storage
title Multi-Bit Resistive Random-Access Memory Based on Two-Dimensional MoO<sub>3</sub> Layers
title_full Multi-Bit Resistive Random-Access Memory Based on Two-Dimensional MoO<sub>3</sub> Layers
title_fullStr Multi-Bit Resistive Random-Access Memory Based on Two-Dimensional MoO<sub>3</sub> Layers
title_full_unstemmed Multi-Bit Resistive Random-Access Memory Based on Two-Dimensional MoO<sub>3</sub> Layers
title_short Multi-Bit Resistive Random-Access Memory Based on Two-Dimensional MoO<sub>3</sub> Layers
title_sort multi bit resistive random access memory based on two dimensional moo sub 3 sub layers
topic <i>α</i>-MoO<sub>3</sub> nanosheet
two-dimensional metal oxides
resistive switching layer
resistive random access memory
multilevel storage
url https://www.mdpi.com/2079-4991/15/13/1033
work_keys_str_mv AT kailiu multibitresistiverandomaccessmemorybasedontwodimensionalmoosub3sublayers
AT wenguijiang multibitresistiverandomaccessmemorybasedontwodimensionalmoosub3sublayers
AT liangzhou multibitresistiverandomaccessmemorybasedontwodimensionalmoosub3sublayers
AT yinkangzhou multibitresistiverandomaccessmemorybasedontwodimensionalmoosub3sublayers
AT minghuihu multibitresistiverandomaccessmemorybasedontwodimensionalmoosub3sublayers
AT yuchengeng multibitresistiverandomaccessmemorybasedontwodimensionalmoosub3sublayers
AT yiyuanzhang multibitresistiverandomaccessmemorybasedontwodimensionalmoosub3sublayers
AT yiqiao multibitresistiverandomaccessmemorybasedontwodimensionalmoosub3sublayers
AT rongmingwang multibitresistiverandomaccessmemorybasedontwodimensionalmoosub3sublayers
AT yinghuisun multibitresistiverandomaccessmemorybasedontwodimensionalmoosub3sublayers