APA (7th ed.) Citation

Šilėnas, A., Staišiūnas, L., Kalinauskas, P., Leinartas, K., Grigucevičienė, A., Lučun, A., . . . Juzeliūnas, E. Thin hafnia layer on silicon – Study of interfacial charging and charge transfer by resistometry and photoelectrochemistry. Elsevier.

Chicago Style (17th ed.) Citation

Šilėnas, Aldis, Laurynas Staišiūnas, Putinas Kalinauskas, Konstantinas Leinartas, Asta Grigucevičienė, Andžej Lučun, Skirmantė Tutlienė, and Eimutis Juzeliūnas. Thin Hafnia Layer on Silicon – Study of Interfacial Charging and Charge Transfer by Resistometry and Photoelectrochemistry. Elsevier.

MLA (9th ed.) Citation

Šilėnas, Aldis, et al. Thin Hafnia Layer on Silicon – Study of Interfacial Charging and Charge Transfer by Resistometry and Photoelectrochemistry. Elsevier.