Integrated anti-electronics for positron annihilation spectroscopy

Abstract Imaging the features of a sample using Positron Annihilation Spectroscopy (PAS) is currently achieved by rastering, i.e. by scanning the sample surface with a sharply focused positron beam. However, a beam of arbitrary shape (sculpted beam) would allow the application of more versatile sing...

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Main Author: Francesco Guatieri
Format: Article
Language:English
Published: Nature Portfolio 2025-02-01
Series:Scientific Reports
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Online Access:https://doi.org/10.1038/s41598-025-89630-9
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author Francesco Guatieri
author_facet Francesco Guatieri
author_sort Francesco Guatieri
collection DOAJ
description Abstract Imaging the features of a sample using Positron Annihilation Spectroscopy (PAS) is currently achieved by rastering, i.e. by scanning the sample surface with a sharply focused positron beam. However, a beam of arbitrary shape (sculpted beam) would allow the application of more versatile single-pixel imaging (SPI) techniques. I introduce the design of a microelectronic device employing a 2D array of Zener diodes as an active positron moderator, capable of sculpting positron beams with $${6}\,\upmu \hbox {m}$$ resolution. The re-emitted positrons are accelerated towards the sample through a miniaturized electrostatic lens system and reaching $${100}\,\hbox {nm}$$ resolution. The fast switch-on ( $${90}\,\hbox {ps}$$ ) and switch-off ( $${250}\,\hbox {ps}$$ ) time of the device would enable state-of-the-art positron annihilation lifetime spectroscopy (PALS) and PAS imaging with high spatial and temporal resolution.
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spelling doaj-art-c0cd7f3cffc34effbc591de9a800bf392025-08-20T02:15:00ZengNature PortfolioScientific Reports2045-23222025-02-0115111010.1038/s41598-025-89630-9Integrated anti-electronics for positron annihilation spectroscopyFrancesco Guatieri0Forschungs-Neutronenquelle Heinz Maier-Leibnitz (FRM II) Technische Universität MünchenAbstract Imaging the features of a sample using Positron Annihilation Spectroscopy (PAS) is currently achieved by rastering, i.e. by scanning the sample surface with a sharply focused positron beam. However, a beam of arbitrary shape (sculpted beam) would allow the application of more versatile single-pixel imaging (SPI) techniques. I introduce the design of a microelectronic device employing a 2D array of Zener diodes as an active positron moderator, capable of sculpting positron beams with $${6}\,\upmu \hbox {m}$$ resolution. The re-emitted positrons are accelerated towards the sample through a miniaturized electrostatic lens system and reaching $${100}\,\hbox {nm}$$ resolution. The fast switch-on ( $${90}\,\hbox {ps}$$ ) and switch-off ( $${250}\,\hbox {ps}$$ ) time of the device would enable state-of-the-art positron annihilation lifetime spectroscopy (PALS) and PAS imaging with high spatial and temporal resolution.https://doi.org/10.1038/s41598-025-89630-9PositronMicroelectronicsImaging
spellingShingle Francesco Guatieri
Integrated anti-electronics for positron annihilation spectroscopy
Scientific Reports
Positron
Microelectronics
Imaging
title Integrated anti-electronics for positron annihilation spectroscopy
title_full Integrated anti-electronics for positron annihilation spectroscopy
title_fullStr Integrated anti-electronics for positron annihilation spectroscopy
title_full_unstemmed Integrated anti-electronics for positron annihilation spectroscopy
title_short Integrated anti-electronics for positron annihilation spectroscopy
title_sort integrated anti electronics for positron annihilation spectroscopy
topic Positron
Microelectronics
Imaging
url https://doi.org/10.1038/s41598-025-89630-9
work_keys_str_mv AT francescoguatieri integratedantielectronicsforpositronannihilationspectroscopy