Integrated anti-electronics for positron annihilation spectroscopy
Abstract Imaging the features of a sample using Positron Annihilation Spectroscopy (PAS) is currently achieved by rastering, i.e. by scanning the sample surface with a sharply focused positron beam. However, a beam of arbitrary shape (sculpted beam) would allow the application of more versatile sing...
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| Format: | Article |
| Language: | English |
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Nature Portfolio
2025-02-01
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| Series: | Scientific Reports |
| Subjects: | |
| Online Access: | https://doi.org/10.1038/s41598-025-89630-9 |
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| Summary: | Abstract Imaging the features of a sample using Positron Annihilation Spectroscopy (PAS) is currently achieved by rastering, i.e. by scanning the sample surface with a sharply focused positron beam. However, a beam of arbitrary shape (sculpted beam) would allow the application of more versatile single-pixel imaging (SPI) techniques. I introduce the design of a microelectronic device employing a 2D array of Zener diodes as an active positron moderator, capable of sculpting positron beams with $${6}\,\upmu \hbox {m}$$ resolution. The re-emitted positrons are accelerated towards the sample through a miniaturized electrostatic lens system and reaching $${100}\,\hbox {nm}$$ resolution. The fast switch-on ( $${90}\,\hbox {ps}$$ ) and switch-off ( $${250}\,\hbox {ps}$$ ) time of the device would enable state-of-the-art positron annihilation lifetime spectroscopy (PALS) and PAS imaging with high spatial and temporal resolution. |
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| ISSN: | 2045-2322 |