Fabrication of Ultra‐Thick Masks for X‐Ray Phase Contrast Imaging at Higher Energy
Abstract X‐ray phase contrast imaging (XPCI) provides higher sensitivity to contrast between low absorbing objects that can be invisible to conventional attenuation‐based X‐ray imaging. XPCI's main application is so far focused on medical areas at relatively low energies (< 100 keV). The tra...
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| Main Authors: | , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2025-04-01
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| Series: | Advanced Materials Interfaces |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/admi.202400749 |
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