Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications
Abstract Aerospace dielectric components on spacecrafts are frequently exposed to surface charging. Here the dynamic charging behaviours of advanced aerospace dielectrics under electron beam irradiation are investigated. Combined measurement of dielectric secondary emission yield (SEY) and trap dist...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
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Wiley
2025-04-01
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| Series: | High Voltage |
| Online Access: | https://doi.org/10.1049/hve2.70020 |
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| _version_ | 1849713253357191168 |
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| author | Guangyu Sun Xiong Yang Wentong An Kun Huang Xiaogang Qin Baipeng Song Guanjun Zhang |
| author_facet | Guangyu Sun Xiong Yang Wentong An Kun Huang Xiaogang Qin Baipeng Song Guanjun Zhang |
| author_sort | Guangyu Sun |
| collection | DOAJ |
| description | Abstract Aerospace dielectric components on spacecrafts are frequently exposed to surface charging. Here the dynamic charging behaviours of advanced aerospace dielectrics under electron beam irradiation are investigated. Combined measurement of dielectric secondary emission yield (SEY) and trap distribution provides input parameters of a drift‐diffusion transport model reproducing the beam‐irradiated dielectric charging processes. The model reveals the spatial–temporal evolutions of the current, charge density, and electric field distribution. The model‐predicted sample current, SEY and surface potential, in a surface layer of 1 μm and with incident electron energy range of 10–30 keV, are compared with the experiments, showing qualitative agreement. The effects of beam energy and current, dielectric material, and sample thickness on the charging processes are explored. Relation between the beam energy and final surface potential is determined, and the beam current is found to only affect the charging speed. Dielectric parameters including the mass density, permittivity, surface resistivity, trap state distribution, electron affinity, together influence the charging speed and final charged state. |
| format | Article |
| id | doaj-art-bcc7dd9ba2e6406a88e16907926b0bb8 |
| institution | DOAJ |
| issn | 2397-7264 |
| language | English |
| publishDate | 2025-04-01 |
| publisher | Wiley |
| record_format | Article |
| series | High Voltage |
| spelling | doaj-art-bcc7dd9ba2e6406a88e16907926b0bb82025-08-20T03:14:01ZengWileyHigh Voltage2397-72642025-04-0110230531510.1049/hve2.70020Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applicationsGuangyu Sun0Xiong Yang1Wentong An2Kun Huang3Xiaogang Qin4Baipeng Song5Guanjun Zhang6State Key Laboratory of Electrical Insulation and Power Equipment School of Electrical Engineering Xi'an Jiaotong University Xi'an ChinaState Key Laboratory of Electrical Insulation and Power Equipment School of Electrical Engineering Xi'an Jiaotong University Xi'an ChinaState Key Laboratory of Electrical Insulation and Power Equipment School of Electrical Engineering Xi'an Jiaotong University Xi'an ChinaState Grid Jiangxi Electric Power Research Institute Nanchang ChinaScience and Technology on Vacuum Technology and Physics Laboratory Lanzhou Institute of Physics Lanzhou ChinaState Key Laboratory of Electrical Insulation and Power Equipment School of Electrical Engineering Xi'an Jiaotong University Xi'an ChinaState Key Laboratory of Electrical Insulation and Power Equipment School of Electrical Engineering Xi'an Jiaotong University Xi'an ChinaAbstract Aerospace dielectric components on spacecrafts are frequently exposed to surface charging. Here the dynamic charging behaviours of advanced aerospace dielectrics under electron beam irradiation are investigated. Combined measurement of dielectric secondary emission yield (SEY) and trap distribution provides input parameters of a drift‐diffusion transport model reproducing the beam‐irradiated dielectric charging processes. The model reveals the spatial–temporal evolutions of the current, charge density, and electric field distribution. The model‐predicted sample current, SEY and surface potential, in a surface layer of 1 μm and with incident electron energy range of 10–30 keV, are compared with the experiments, showing qualitative agreement. The effects of beam energy and current, dielectric material, and sample thickness on the charging processes are explored. Relation between the beam energy and final surface potential is determined, and the beam current is found to only affect the charging speed. Dielectric parameters including the mass density, permittivity, surface resistivity, trap state distribution, electron affinity, together influence the charging speed and final charged state.https://doi.org/10.1049/hve2.70020 |
| spellingShingle | Guangyu Sun Xiong Yang Wentong An Kun Huang Xiaogang Qin Baipeng Song Guanjun Zhang Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications High Voltage |
| title | Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications |
| title_full | Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications |
| title_fullStr | Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications |
| title_full_unstemmed | Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications |
| title_short | Investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications |
| title_sort | investigation of the dynamic charge transport behaviours under electron beam irradiation of advanced insulation materials for aerospace applications |
| url | https://doi.org/10.1049/hve2.70020 |
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