Nondestructive Quality Control for Microarray Production
The use of microarrays to monitor gene expression has become a standard research tool at both academic and industrial research institutions. Quality control of common printing defects during DNA deposition onto glass substrates is critical to maintaining data integrity and preventing the needless co...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor & Francis Group
2002-05-01
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| Series: | BioTechniques |
| Online Access: | https://www.future-science.com/doi/10.2144/02325st06 |
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| _version_ | 1850152165397495808 |
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| author | Jeffrey R. Shearstone Norman E. Allaire Michael E. Getman Steven Perrin |
| author_facet | Jeffrey R. Shearstone Norman E. Allaire Michael E. Getman Steven Perrin |
| author_sort | Jeffrey R. Shearstone |
| collection | DOAJ |
| description | The use of microarrays to monitor gene expression has become a standard research tool at both academic and industrial research institutions. Quality control of common printing defects during DNA deposition onto glass substrates is critical to maintaining data integrity and preventing the needless consumption of precious RNA, labeling reagents, and time. Here we demonstrate a nondestructive method for monitoring the quality of every spot on every chip of a microarray production run. We have identified many common manufacturing defects, while not perturbing the attachment of our oligonucleotide target to the substrate or altering further hybridization. This protocol is simple, fast, and inexpensive. |
| format | Article |
| id | doaj-art-bc6b68e9adf74d4985cdefc6d6c83ad6 |
| institution | OA Journals |
| issn | 0736-6205 1940-9818 |
| language | English |
| publishDate | 2002-05-01 |
| publisher | Taylor & Francis Group |
| record_format | Article |
| series | BioTechniques |
| spelling | doaj-art-bc6b68e9adf74d4985cdefc6d6c83ad62025-08-20T02:26:03ZengTaylor & Francis GroupBioTechniques0736-62051940-98182002-05-013251051105710.2144/02325st06Nondestructive Quality Control for Microarray ProductionJeffrey R. Shearstone0Norman E. Allaire1Michael E. Getman2Steven Perrin31Biogen, Cambridge, MA, USA1Biogen, Cambridge, MA, USA1Biogen, Cambridge, MA, USA1Biogen, Cambridge, MA, USAThe use of microarrays to monitor gene expression has become a standard research tool at both academic and industrial research institutions. Quality control of common printing defects during DNA deposition onto glass substrates is critical to maintaining data integrity and preventing the needless consumption of precious RNA, labeling reagents, and time. Here we demonstrate a nondestructive method for monitoring the quality of every spot on every chip of a microarray production run. We have identified many common manufacturing defects, while not perturbing the attachment of our oligonucleotide target to the substrate or altering further hybridization. This protocol is simple, fast, and inexpensive.https://www.future-science.com/doi/10.2144/02325st06 |
| spellingShingle | Jeffrey R. Shearstone Norman E. Allaire Michael E. Getman Steven Perrin Nondestructive Quality Control for Microarray Production BioTechniques |
| title | Nondestructive Quality Control for Microarray Production |
| title_full | Nondestructive Quality Control for Microarray Production |
| title_fullStr | Nondestructive Quality Control for Microarray Production |
| title_full_unstemmed | Nondestructive Quality Control for Microarray Production |
| title_short | Nondestructive Quality Control for Microarray Production |
| title_sort | nondestructive quality control for microarray production |
| url | https://www.future-science.com/doi/10.2144/02325st06 |
| work_keys_str_mv | AT jeffreyrshearstone nondestructivequalitycontrolformicroarrayproduction AT normaneallaire nondestructivequalitycontrolformicroarrayproduction AT michaelegetman nondestructivequalitycontrolformicroarrayproduction AT stevenperrin nondestructivequalitycontrolformicroarrayproduction |