Transparent memory tests with even repeating addresses for storage devices
The urgency of the problem of memory testing of modern computing systems is shown. Mathematical models describing the faulty states of storage devices and the methods used for their detection are investigated. The concept of address sequences (pA) with an even repetition of addresses is introduced,...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | Russian |
| Published: |
National Academy of Sciences of Belarus, the United Institute of Informatics Problems
2021-09-01
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| Series: | Informatika |
| Subjects: | |
| Online Access: | https://inf.grid.by/jour/article/view/1137 |
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