Submicron quantum dot light-emitting diodes enabled by pixelated topological meta-mirror

As a highly competitive display technology, the realization of pixelated full color quantum dot light emitting diodes (QLEDs) is an indispensable step for high resolution display. Meanwhile, with the rise of near eye display, a submicron pixel size is required for a high-resolution display within a...

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Bibliographic Details
Main Authors: Ye Taikang, Tian Dadi, Wu Dan, Sun Xiao Wei, Wang Kai
Format: Article
Language:English
Published: De Gruyter 2025-01-01
Series:Nanophotonics
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Online Access:https://doi.org/10.1515/nanoph-2024-0543
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Summary:As a highly competitive display technology, the realization of pixelated full color quantum dot light emitting diodes (QLEDs) is an indispensable step for high resolution display. Meanwhile, with the rise of near eye display, a submicron pixel size is required for a high-resolution display within a small area less than 1 inch. However, the realization of submicron full color quantum dot pixels by direct patterning is still a big challenge. In this work, we propose a topological meta-mirror structure for the realization of submicron RGB QLEDs. The pixelated topological meta-mirror is introduced with a sufficient design freedom. A powerful light manipulation capability is offered by the topological meta-mirror even with limited period number, which enables the construction of RGB meta-cavities. The pure RGB emissions from meta-cavities can be realized with energy ratios larger than 88 % based on optimized topological meta-mirrors. For a subpixel size of 1 μm, the energy ratios for target color emission can still be larger than 85 %, which indicates a pure color emission. And a minimum subpixel size of 0.6 μm and an ultra-high pixel density of 21,666 pixel per inch can be realized with a 3 × 3 topological meta-mirror array. The proposed meta-cavity structure based on topological meta-mirror provides a new technique route for full color QLEDs especially for high pixel density required scenarios.
ISSN:2192-8614