APA (7th ed.) Citation

Li, D., Peng, X., Ye, Z., Cao, H., Wang, B., Zhao, X., & Shi, F. Deep Learning-Assisted Microscopic Polarization Inspection of Micro-Nano Damage Precursors: Automatic, Non-Destructive Metrology for Additive Manufacturing Devices. MDPI AG.

Chicago Style (17th ed.) Citation

Li, Dingkang, Xing Peng, Zhenfeng Ye, Hongbing Cao, Bo Wang, Xinjie Zhao, and Feng Shi. Deep Learning-Assisted Microscopic Polarization Inspection of Micro-Nano Damage Precursors: Automatic, Non-Destructive Metrology for Additive Manufacturing Devices. MDPI AG.

MLA (9th ed.) Citation

Li, Dingkang, et al. Deep Learning-Assisted Microscopic Polarization Inspection of Micro-Nano Damage Precursors: Automatic, Non-Destructive Metrology for Additive Manufacturing Devices. MDPI AG.