Ohno, K., Nishiura, H., Sato, K., Sakamoto, S., & Ikeo, H. Failure Mechanisms That Cause High Electrical Leakage in Multilayer Ceramic Capacitors. Wiley.
Chicago Style (17th ed.) CitationOhno, Katsuhiro, Hisakazu Nishiura, Ken Sato, Sanpei Sakamoto, and Hirofumi Ikeo. Failure Mechanisms That Cause High Electrical Leakage in Multilayer Ceramic Capacitors. Wiley.
MLA (9th ed.) CitationOhno, Katsuhiro, et al. Failure Mechanisms That Cause High Electrical Leakage in Multilayer Ceramic Capacitors. Wiley.
Warning: These citations may not always be 100% accurate.