Thermal Effect and Frequency Response Analyses on Heterojunction Bipolar Power Transistor

Heterojunction bipolar transistors (HBT) based on Npn AlGaAs/GaAs material system have attracted considerable attention for microwave power and digital applications due to their high speed and high current capabilities. In this paper, a numerical model based on the Npn AlGaAs/GaAs HBT structure for...

Full description

Saved in:
Bibliographic Details
Main Authors: K. F. Yarn, K. H. Ho
Format: Article
Language:English
Published: Wiley 2001-01-01
Series:Active and Passive Electronic Components
Online Access:http://dx.doi.org/10.1155/2001/78036
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1850160279603642368
author K. F. Yarn
K. H. Ho
author_facet K. F. Yarn
K. H. Ho
author_sort K. F. Yarn
collection DOAJ
description Heterojunction bipolar transistors (HBT) based on Npn AlGaAs/GaAs material system have attracted considerable attention for microwave power and digital applications due to their high speed and high current capabilities. In this paper, a numerical model based on the Npn AlGaAs/GaAs HBT structure for the carrier transport is presented. Three figures of merit on device operation, current gain, cut-off frequency and maximum oscillation frequency are calculated. Besides, thermal instability plays an important role on power HBT resulted from the low thermal conductivity in GaAs. The generated heat will increase the junction temperature and cause self-destruction. Therefore, the thermal runaway study of the junction temperature, current–voltage (IV) characteristics and frequency response using an analytical thermal model is described.
format Article
id doaj-art-b682ad7835db45d2ba5f94aff90c5277
institution OA Journals
issn 0882-7516
1563-5031
language English
publishDate 2001-01-01
publisher Wiley
record_format Article
series Active and Passive Electronic Components
spelling doaj-art-b682ad7835db45d2ba5f94aff90c52772025-08-20T02:23:11ZengWileyActive and Passive Electronic Components0882-75161563-50312001-01-0124426528710.1155/2001/78036Thermal Effect and Frequency Response Analyses on Heterojunction Bipolar Power TransistorK. F. Yarn0K. H. Ho1Optoelectronic Semiconductor Center, Department of Electrical Engineering, Far East College, Hsin-Shih, Taiwan 744, Tainan, Chinalnstitute of Microelectronics, Department of Electrical Engineering, National Cheng-Kung University, Taiwan 701, Tainan, ChinaHeterojunction bipolar transistors (HBT) based on Npn AlGaAs/GaAs material system have attracted considerable attention for microwave power and digital applications due to their high speed and high current capabilities. In this paper, a numerical model based on the Npn AlGaAs/GaAs HBT structure for the carrier transport is presented. Three figures of merit on device operation, current gain, cut-off frequency and maximum oscillation frequency are calculated. Besides, thermal instability plays an important role on power HBT resulted from the low thermal conductivity in GaAs. The generated heat will increase the junction temperature and cause self-destruction. Therefore, the thermal runaway study of the junction temperature, current–voltage (IV) characteristics and frequency response using an analytical thermal model is described.http://dx.doi.org/10.1155/2001/78036
spellingShingle K. F. Yarn
K. H. Ho
Thermal Effect and Frequency Response Analyses on Heterojunction Bipolar Power Transistor
Active and Passive Electronic Components
title Thermal Effect and Frequency Response Analyses on Heterojunction Bipolar Power Transistor
title_full Thermal Effect and Frequency Response Analyses on Heterojunction Bipolar Power Transistor
title_fullStr Thermal Effect and Frequency Response Analyses on Heterojunction Bipolar Power Transistor
title_full_unstemmed Thermal Effect and Frequency Response Analyses on Heterojunction Bipolar Power Transistor
title_short Thermal Effect and Frequency Response Analyses on Heterojunction Bipolar Power Transistor
title_sort thermal effect and frequency response analyses on heterojunction bipolar power transistor
url http://dx.doi.org/10.1155/2001/78036
work_keys_str_mv AT kfyarn thermaleffectandfrequencyresponseanalysesonheterojunctionbipolarpowertransistor
AT khho thermaleffectandfrequencyresponseanalysesonheterojunctionbipolarpowertransistor