Shi, P., Zhang, Y., Cao, Y., Sun, J., Chen, D., & Kuang, L. DVCW-YOLO for Printed Circuit Board Surface Defect Detection. MDPI AG.
Chicago Style (17th ed.) CitationShi, Pei, Yuyang Zhang, Yunqin Cao, Jiadong Sun, Deji Chen, and Liang Kuang. DVCW-YOLO for Printed Circuit Board Surface Defect Detection. MDPI AG.
MLA (9th ed.) CitationShi, Pei, et al. DVCW-YOLO for Printed Circuit Board Surface Defect Detection. MDPI AG.
Warning: These citations may not always be 100% accurate.