APA (7th ed.) Citation

Kiene, G., Ilik, S., Mastrodomenico, L., Babaie, M., & Sebastiano, F. Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS. IEEE.

Chicago Style (17th ed.) Citation

Kiene, Gerd, Sadik Ilik, Luigi Mastrodomenico, Masoud Babaie, and Fabio Sebastiano. Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS. IEEE.

MLA (9th ed.) Citation

Kiene, Gerd, et al. Cryogenic Characterization of Low-Frequency Noise in 40-nm CMOS. IEEE.