Veit, S., & Steiner, F. Defect Trends in Fire Alarm Systems: A Basis for Risk-Based Inspection (RBI) Approaches. MDPI AG.
Chicago Style (17th ed.) CitationVeit, Stefan, and Frantisek Steiner. Defect Trends in Fire Alarm Systems: A Basis for Risk-Based Inspection (RBI) Approaches. MDPI AG.
MLA (9th ed.) CitationVeit, Stefan, and Frantisek Steiner. Defect Trends in Fire Alarm Systems: A Basis for Risk-Based Inspection (RBI) Approaches. MDPI AG.
Warning: These citations may not always be 100% accurate.