FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials

A review on the recent advances of the three-dimensional (3D) characterization of carbon-based materials was conducted by focused ion beam-scanning electron microscope (FIB-SEM) tomography. Current studies and further potential applications of the FIB-SEM 3D tomography technique for carbon-based mat...

Full description

Saved in:
Bibliographic Details
Main Authors: Nan Nan, Jingxin Wang
Format: Article
Language:English
Published: Wiley 2019-01-01
Series:Advances in Materials Science and Engineering
Online Access:http://dx.doi.org/10.1155/2019/8680715
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1849691942320865280
author Nan Nan
Jingxin Wang
author_facet Nan Nan
Jingxin Wang
author_sort Nan Nan
collection DOAJ
description A review on the recent advances of the three-dimensional (3D) characterization of carbon-based materials was conducted by focused ion beam-scanning electron microscope (FIB-SEM) tomography. Current studies and further potential applications of the FIB-SEM 3D tomography technique for carbon-based materials were discussed. The goal of this paper is to highlight the advances of FIB-SEM 3D reconstruction to reveal the high and accurate resolution of internal structures of carbon-based materials and provide suggestions for the adoption and improvement of the FIB-SEM tomography system for a broad carbon-based research to achieve the best examination performances and enhance the development of innovative carbon-based materials.
format Article
id doaj-art-b3c4f694f06e468b88eb004ca89fe513
institution DOAJ
issn 1687-8434
1687-8442
language English
publishDate 2019-01-01
publisher Wiley
record_format Article
series Advances in Materials Science and Engineering
spelling doaj-art-b3c4f694f06e468b88eb004ca89fe5132025-08-20T03:20:51ZengWileyAdvances in Materials Science and Engineering1687-84341687-84422019-01-01201910.1155/2019/86807158680715FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based MaterialsNan Nan0Jingxin Wang1Division of Forestry and Natural Resources, Davis College of Agriculture, Natural Resources and Design, West Virginia University, Morgantown, WV 26505, USADivision of Forestry and Natural Resources, Davis College of Agriculture, Natural Resources and Design, West Virginia University, Morgantown, WV 26505, USAA review on the recent advances of the three-dimensional (3D) characterization of carbon-based materials was conducted by focused ion beam-scanning electron microscope (FIB-SEM) tomography. Current studies and further potential applications of the FIB-SEM 3D tomography technique for carbon-based materials were discussed. The goal of this paper is to highlight the advances of FIB-SEM 3D reconstruction to reveal the high and accurate resolution of internal structures of carbon-based materials and provide suggestions for the adoption and improvement of the FIB-SEM tomography system for a broad carbon-based research to achieve the best examination performances and enhance the development of innovative carbon-based materials.http://dx.doi.org/10.1155/2019/8680715
spellingShingle Nan Nan
Jingxin Wang
FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials
Advances in Materials Science and Engineering
title FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials
title_full FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials
title_fullStr FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials
title_full_unstemmed FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials
title_short FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials
title_sort fib sem three dimensional tomography for characterization of carbon based materials
url http://dx.doi.org/10.1155/2019/8680715
work_keys_str_mv AT nannan fibsemthreedimensionaltomographyforcharacterizationofcarbonbasedmaterials
AT jingxinwang fibsemthreedimensionaltomographyforcharacterizationofcarbonbasedmaterials